"as well as defect management techniques that are widely used in flash memory today. "

I'd have to review that ....they bought BAN(Msystems) out and those methods utilized virtual bit mapping for memory management issues.

For the recent Walker issues introduced to the board, I reviewed the memory management issues of one of the two patents recognized by Ritz in its suit for "Federal question"

It functions nothing like e.Digitals, bad cells are only recognized and detected as memory is needed, and at that point makes a virtual bit map adjustment.

e.Digital does a full memory "integrity test" at FORMAT and marks those issues bad within its logical to physical Format. Data will not be written to those dead issues. It's not only that e.Digital can simply mark those issues on the logical overlay. When they FORMAT the memory, they match the sector (erase block) to meet a certain % granularity bad memory to good memory in maximizing memory usage. e.Digital from the get go was to maximize NAND flash erase block (small) compared to NOR erase block (very large).

Sandisk does not have what e.Digital has, Sandisk is built on virtual bit map methods.

e.Digital put together an OS that is built on header schemes...and the novility of thoses headers is the data that is placed in them.

You first link was derailed

doni