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Message: MVIS Patent Application 20110176068

Closed Loop Feedback for Electronic Beam Alignment

Abstract

Briefly, in accordance with one or more embodiments, a closed loop feedback
system for electronic beam alignment in a scanned beam display comprises a light
source to emit one or more light beams, a controller to provide a control signal
to drive the light source, a scanning platform to receive the one or more light
beams and scan the light beams in a scanning pattern to project an image, and an
alignment detector to provide a feedback signal indicative of beam position
information of the light beams in the far field to the controller. An optic may
be disposed in the beam path to magnify and/or to transform beam position
information into the far field for the one or more alignment detectors. The
controller adjusts the control signal in response to the feedback signal
received from the alignment detector to maintain alignment of the light beams in
a far field.

http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PG01&s1=microvision&s2=scanning&OS=microvision+AND+scanning&RS=microvision+AND+scanning

(thanks to me_wwwing of the Yahoo private MVIS forum)

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